# SBIR Phase II: Advanced Metrology System for Surface and Bonding Quality Control in Semiconductor Manufacturing

**Budget Signal Score:** 70/100

| Field | Value |
|---|---|
| Institution | FRINGE METROLOGY LLC |
| Location | TUCSON, AZ |
| Project | SBIR Phase II: Advanced Metrology System for Surface and Bonding Quality Control in Semiconductor Manufacturing |
| Award amount | $1,230,258 |
| Obligated so far | $312,390 |
| Awarded | 2026-08-24 |
| Period | 2026-09-01 to 2028-08-31 |
| Program | SBIR Phase II |
| Directorate / division | TIP / SSB |
| Award ID | 2535761 |

## Why this score
- Award of $1M or more.
- Equipment- and compute-heavy field.

Source: U.S. National Science Foundation Awards API (https://www.nsf.gov/awardsearch/showAward?AWD_ID=2535761). Last refreshed: 2026-11-04T18:13:44.963Z.
Award data comes from the NSF Awards API and may be amended by NSF. Institution-level only; investigator contact details are not included. Informational only.