# Low Fidelity Sensing for Scalable In-Process Defect Characterization in Metal Additive Manufacturing

**Budget Signal Score:** 55/100

| Field | Value |
|---|---|
| Institution | Washington State University |
| Location | PULLMAN, WA |
| Project | Low Fidelity Sensing for Scalable In-Process Defect Characterization in Metal Additive Manufacturing |
| Award amount | $300,000 |
| Obligated so far | $300,000 |
| Awarded | 2026-08-13 |
| Period | 2026-09-01 to 2029-08-31 |
| Program | AM-Advanced Manufacturing |
| Directorate / division | ENG / CMMI |
| Award ID | 2624720 |

## Why this score
- Award of $300K or more.
- Equipment- and compute-heavy field.

Source: U.S. National Science Foundation Awards API (https://www.nsf.gov/awardsearch/showAward?AWD_ID=2624720). Last refreshed: 2026-11-03T18:10:42.804Z.
Award data comes from the NSF Awards API and may be amended by NSF. Institution-level only; investigator contact details are not included. Informational only.